OPTICAL ANALYSIS LABORATORY
A complete investigation of the mineralogical and microstructural properties of samples to be used in the experiments and geochemical analyses is essential in order to get out the most of natural, experimental, and industrial materials. The Petro-Volcanology Research Group has vast experience in the petrographic and microstructural analysis of specimens. Thanks to our skills in image analysis programming we can count on a wide range of efficient computer codes for quantitative analyses of digital images.
- Zeiss Axioskop transmitted light petrographic microscope
- Leitz Laborlux POL S transmitted light petrographic microscope
- CARL ZEISS reflected light stereo microscope
- KYOWA reflected light stereo microscope SD-2PL
- REFLECTA 8x-Scan transmitted light thin section scanner
Transmitted Light Petrographic Microscopes
Optical characterization of natural, experimental and industrial samples is a basic step towards understanding of the processes involved in their formation and modification. Our transmitted light petrographic microscopes, equipped with high-resolution USB cameras for acquisition of digital images, are state-of-the-art tools for detailed mineralogical and microstructural analyses of thin sections. Combined with digital image processing software (both 3rd-party and in-house codes) these tools can provide accurate information about structural properties of analysed samples.
Reflected Light Stereo Microscopes
Reflected light stereo microscopes are essential tools for surface characterization of natural, experimental and industrial samples. Our reflected light stereo microscopes, equipped with high-resolution USB cameras for acquisition of digital images, are state-of-the-art tools for detailed analysis of sample surfaces. Combined with digital image processing software (both 3rd-party and in-house codes) these tools can provide accurate information on surface characteristics of analysed samples.
Transmitted light thin section scanner
Microscopes can provide detailed information on small areas of specimens. However, it is often important to have a general view of the sample in order to evaluate the spatial distribution and mutual relationships of constituents (minerals, vesicles, fragments, etc …). Our transmitted light thin section scanner can acquire whole thin sections for large-scale examinations. Polarizing laminae cut at variable angles allow for multiple acquisition of sample sections, as in the transmitted light petrographic microscope.